12/16
Evaluation
g. Narrow space between two 1-layer lines (3%)
Measure the space under CCD.
Use the same image of c.
Smallest space (3%)
Worst (1%)
Others (2%)
h. Resistance for the 1-layer line after sintering (R1) (2%)
Lowest resistance (2%)
Worst (0%)
Others (1%)

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