Referred Journal Papers

[1]	Wu, Chien-Wei. (Accepted). An efficient inspection scheme for variables based on Taguchi capability index. European Journal of Operational Research. 【SCI, EI】
[2]	Aslam, M., Wu, Chien-Wei, Azam, M and Jun, C. H. (Accepted). Sampling inspection by variables for resubmitted lots based on process capability index C_pk for normally distributed items. Applied Mathematical Modelling. 【SCI, EI】
[3]	Wu, Chien-Wei, Chang, Y. C. and Liao, M. Y. (Accepted). Fuzzy estimation for process loss assessment. Journal of the Chinese Institute of Engineers. 【SCI, EI】
[4]	Aslam, M., Wu, Chien-Wei, Jun, C. H., Azam, M. and Negrin, I. (Accepted). Developing a variables repetitive sampling plan based on C_pk with unknown mean and variance. Journal of Statistical Computation and Simulation. 【SCI, EI】
[5]	Wu, Chien-Wei (Accepted). Process performance evaluation based on Taguchi capability index with the consideration of measurement errors. International Journal of Systems Science. 【SCI, EI】iFirst. DOI:10.1080/00207721.2012.659292
[6]	Wu, Chien-Wei, Aslam, M. and Jun, C. H. (Accepted). Variables sampling inspection scheme for resubmitted lots based on the process capability index C_pk. European Journal of Operational Research.【SCI, EI】
[7]	Wu, Chien-Wei. (Accepted). A Bayesian approach for measuring process performance with asymmetric tolerances. European Journal of Industrial Engineering.【SCI, EI】
[8]	Wu, Chien-Wei and Shu, M. H. (Accepted). A novel approach for measuring the largest process-loss information in multiple production line conditions. International Journal of Production Research. 【SCI, EI】
[9]	Lin, T. Y., Wu, Chien-Wei, Chen, J. C. and Chiou, Y. H. (Accepted). Applying Bayesian approach to assess process capability for asymmetric tolerances based on C_pmk" index. Applied Mathematical Modelling.【SCI, EI*】
[10]	Wu, Chien-Wei (Accepted). Process performance evaluation based on Taguchi capability index with the consideration of measurement errors. International Journal of Systems Science. 【SCI, EI】
[11]	Wu, Chien-Wei, Liao, M. Y. and Chen, J. C. (Accepted). An improved approach for constructing lower confidence bound on process yield. European Journal of Industrial Engineering. 【SCI, EI】
[12]	Wu, Chien-Wei. (Accepted). Using a novel approach to assess process performance in the presence of measurement errors. Journal of Statistical Computation and Simulation.【SCI, EI】
[13]	Wu, Chien-Wei and. Kuo, N. C. (Accepted). A fuzzy approach to evaluate process performance based on imprecise data. Journal of Quality.【EI】 (Invited paper)
[14]	Pearn, W. L., Liao, M. Y., Wu, Chien-Wei, and Chu, Y. T. (Accepted). Two tests for supplier selection based on process yield. Journal of Testing and Evaluation.【SCI, EI】
[15]	Wu, Chien-Wei. (2010). Implementation and power analysis of a supplier selection method for unilateral processes. International Journal of Reliability and Quality Performance, 2(1), 43-52. (Invited paper)
[16]	Wu, Chien-Wei, Shu, M. H., Pearn, W. L. and Tai, Y. C. (2010). Estimating and testing process accuracy with extension to asymmetric tolerances. Quality & Quantity, 44(5), 985-995.【SSCI, SCI】
[17]	Wu, Chien-Wei and Huang, P. H. (2010). Generalized confidence intervals for comparing the capability of two processes. Communications in Statistics: Theory and Methods, 39(13), 2351-2364. 【SCI, EI】
[18]	Liao, M. Y. and Wu, Chien-Wei (2010). Evaluating process performance based on the incapability index for measurements with uncertainty. Expert Systems with Applications, 37(8), 5999-6006. 【SCI, EI】
[19]	Wu, Chien-Wei, Liao, M. Y. and Shu, M. H. (2010). Process performance evaluation with imprecise information. Journal of Testing and Evaluation, 38(2), 137-142.【SCI, EI】
[20]	Liao, M. Y., Kang, H. Y., Lee, A. H. I. and Wu, Chien-Wei (2010). Capability testing based on subsamples: a case on photolithography process control in wafer fabrication. Journal of Testing and Evaluation, 38(2), 222-231.【SCI, EI】
[21]	Liao, M. Y. and Wu, Chien-Wei (2010). An alternative approach to controlling tool wear problem with an application to grinding wheels management in manufacturing silicon wafers. Journal of Information and Optimization Sciences, 31(1), 231-244【EI】
[22]	Wu, Chien-Wei and Lin, T. Y. (2009). A Bayesian procedure for assessing process performance based on the third generation capability index. Journal of Applied Statistics, 36(11), 1205-1223.【SCI】
[23]	Wu, Chien-Wei, Shu, M. H. and Cheng, F. T. (2009). Generalized confidence intervals for assessing process capability of multiple production lines. Quality and Reliability Engineering International, 25(6), 701-716.【SCI, EI】
[24]	Wu, Chien-Wei, Pearn, W. L. and Kotz, S. (2009). An overview of theory and practice on process capability indices for quality assurance. International Journal of Production Economics, 117(2), 338-359.【SCI, EI】
[25]	Wu, Chien-Wei and Liao, M. Y. (2009). Estimating and testing process yield with imprecise data. Expert Systems with Applications, 36(8), 11006-11012.【SCI, EI】
[26]	Wu, Chien-Wei, Shu, M. H., Pearn, W. L. and Cheng, F. T. (2009). A comparison of methods for estimating loss-based capability index. Journal of Statistical Computation and Simulation, 79(9), 1129-1141.【SCI, EI】
[27]	Wu, Chien-Wei (2009). Decision-making in testing process performance with fuzzy data. European Journal of Operational Research, 193(2), 499-509.【SCI, EI】
[28]	Chang, Y. C. and Wu, Chien-Wei (2008). Assessing process capability based on the lower confidence bound of C_pk for asymmetric tolerances. European Journal of Operational Research, 190(1), 205-227.【SCI, EI】
[29]	Wu, Chien-Wei (2008). Assessing process capability based on Bayesian approach with subsamples. European Journal of Operational Research, 184(1), 207-228.【SCI, EI】
[30]	Wu, Chien-Wei and Pearn, W. L. (2008). A variables sampling plan based on C_pmk for product acceptance determination. European Journal of Operational Research, 184(2), 549-560.【SCI, EI】
[31]	Wu, Chien-Wei and Chang, Y. C. (2008). A hypothesis testing procedure on assessing process performance for asymmetric tolerances. Communications in Statistics: Theory and Methods, 37(12), 1959-1976.【SCI, EI】
[32]	Hsu, B. M., Wu, Chien-Wei and Shu, M. H. (2008).Generalized confidence intervals for the process capability index C_pm. Metrika - International Journal for Theoretical and Applied Statistics, 68(1), 65-82.【SCI】
[33]	Wu, Chien-Wei, Shu, M. H., Pearn, W. L. and Liu, K. H. (2008). Bootstrap approach for supplier selection based on production yield. International Journal of Production Research, 46(18), 5211-5230.【SCI, EI】
[34]	Chang, Y. C., Pearn, W. L. and Wu, Chien-Wei (2007). On the sampling distributions of the estimated process loss indices with asymmetric tolerances. Communications in Statistics: Simulation and Computation, 36(6), 1153-1170.【SCI, EI】
[35]	Wu, Chien-Wei (2007). An alternative approach to test process capability for unilateral specification with subsamples. International Journal of Production Research, 45(22), 5397-5415. 【SCI, EI】
[36]	Wu, Chien-Wei and Shu, M. H. (2007). A Bayesian procedure for assessing process performance based on expected relative loss with asymmetric tolerances. Journal of Applied Statistics, 34(9), 1109-1123.【SCI】
[37]	Huwang, Longcheen, Yeh, Arthur B. and Wu, Chien-Wei (2007). Monitoring multivariate process variability for individual observations. Journal of Quality Technology, 39(3), 258-278.【SCI, EI】
[38]	Wu, Chien-Wei, Pearn, W. L., Chang, C. S. and Chen, H. C. (2007). Accuracy analysis of the percentile method for estimating non-normal manufacturing quality. Communications in Statistics: Simulation and Computation, 36(3), 657-697.【SCI, EI】
[39]	Pearn, W. L. and Wu, Chien-Wei (2007). An effective decision making method for product acceptance. Omega – The International Journal of Management Science, 35(1), 12-21. 【SSCI, SCI】
[40]	Pearn, W. L., Chang, Y. C. and Wu, Chien-Wei (2006). Measuring process performance based on expected loss for asymmetric tolerances. Journal of Applied Statistics, 33(10), 1105-1120. 【SCI】
[41]	Wu, Chien-Wei and Pearn, W. L. (2006). Bayesian approach for measuring EEPROM process capability based on the one-sided indices C_PUand C_PL. International Journal of Advanced Manufacturing Technology, 31(1-2), 135-144. 【SCI, EI】
[42]	Pearn, W. L., Chang, Y. C. and Wu, Chien-Wei (2006). Multi-process performance analysis chart based on process loss indices. International Journal of Systems Science, 37(7), 429-435. 【SCI, EI】
[43]	Pearn, W. L., Hsu, Y. C. and Wu,Chien-Wei (2006). Tool replacement for production with a low fraction of defectives. International Journal of Production Research, 44(12), 2313-2326. 【SCI, EI】
[44]	Pearn, W. L., Lin, P. C., Chang, Y. C. and Wu, Chien-Wei (2006). Quality yield measure for processes with asymmetric tolerances. IIE Transactions in Quality and Reliability Engineering, 38(8), 619-633. 【SCI, EI】
[45]	Pearn, W. L. and Wu, Chien-Wei (2006). Production quality and yield assurance for processes with multiple independent characteristics. European Journal of Operational Research, 173(2), 637-647. 【SCI, EI】
[46]	Pearn, W. L. and Wu, Chien-Wei (2006). Variables sampling plans with PPM fraction of defectives and process loss consideration. Journal of the Operational Research Society, 57(4), 450-459. 【SSCI, SCI】
[47]	Pearn, W. L. and Wu, Chien-Wei (2006). Critical acceptance values and sample sizes of a variables sampling plan for very low fraction of defectives. Omega – The International Journal of Management Science, 34(1), 90-101. 【SSCI, SCI】
[48]	Yeh, Arthur B., Huwang, Longcheen and Wu, Chien-Wei (2005). A multivariate EWMA control chart for monitoring process variability with individual observations. IIE Transactions in Quality and Reliability Engineering, 37(11), 1023-1035. 【SCI, EI】
[49]	Pearn, W. L. and Wu, Chien-Wei (2005). An effective modern approach for measuring high-tech product manufacturing process quality. Journal of the Chinese Institute of Industrial Engineers, 22(2), 119-133. 【EI】
[50]	Pearn, W. L., Chang, Y. C. and Wu, Chien-Wei (2005). Bootstrap approach for estimating process quality yield with application to light emitting diodes. International Journal of Advanced Manufacturing Technology, 25(5-6), 560-570. 【SCI, EI】
[51]	Pearn, W. L., Wu, Chien-Wei and Chuang, H. C. (2005). Procedures for testing manufacturing precision C_p based on (Xbar, R) or (Xbar, S) control chart samples. International Journal of Advanced Manufacturing Technology, 25(5-6), 598-607. 【SCI, EI】
[52]	Pearn, W. L. and Wu, Chien-Wei (2005). Process capability assessment for index C_pk based on Bayesian approach. Metrika - International Journal for Theoretical and Applied Statistics, 61(2), 221-234. 【SCI】
[53]	Pearn, W. L., Wu, Chien-Wei and Wang, K. H. (2005). Capability measure for asymmetric tolerances non-normal processes applied to speaker driver manufacturing. International Journal of Advanced Manufacturing Technology, 25(5-6), 506-515. 【SCI, EI】
[54]	Wu, Chien-Wei and Pearn, W. L. (2005). Measuring manufacturing capability for couplers and wavelength division multiplexers. International Journal of Advanced Manufacturing Technology, 25(5-6), 533-541. 【SCI, EI】
[55]	Pearn, W. L. and Wu, Chien-Wei (2005). A Bayesian approach for assessing process precision based on multiple samples. European Journal of Operational Research, 165(3), 685-695. 【SCI, EI】
[56]	Wu, Chien-Wei and Pearn, W. L. (2005). Capability testing based on C_pmwith multiple samples. Quality and Reliability Engineering International, 21(1), 29-42. 【SCI, EI】
[57]	Pearn, W. L., Chang, Y. C. and Wu, Chien-Wei (2004). Quality-yield measure for production with very low fraction of defectives. International Journal of Production Research, 42(23), 4909-4925. 【SCI, EI】
[58]	Pearn, W. L., Chang, Y. C. and Wu, Chien-Wei (2004). Distributional and inferential properties of the process loss indices. Journal of Applied Statistics, 31(9), 1115-1135. 【SCI】
[59]	Pearn, W. L., Wu, Chien-Wei and Lin H. C. (2004). Procedure for supplier selection based on C_pmapplied to super twisted nematic liquid crystal display processes. International Journal of Production Research, 42(13), 2719-2734. 【SCI, EI】

Other Publications

[1]	Pearn, W. L. and Wu, Chien-Wei (2007). Accuracy in Estimating Process Capability Analysis. Encyclopedia of Statistics in Quality and Reliability. Edited by Fabrizio Ruggeri, Fred Faltin and Ron Kenett. John Wiley & Sons.
[2]	Wu, Chien-Wei. (2004). Process Capability Assessment Based on Bayesian Approach. Ph.D. Dissertation, Department of Industrial Engineering and Management, National Chiao Tung University, Taiwan.
[3]	Wu, Chien-Wei. (2002). A Multivariate EWMA Control Chart for Monitoring Process Variability with Individual Observations. Master Thesis, Institute of Statistics, National Tsing Hua University, Taiwan.

Last update: 10 July, 2012